• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The invention relates to a circuit for measuring variations of a supply voltage (VDD) of an electronic circuit, comprising an analog-digital converter (24) for a difference between a value (Vmeas) proportional to the voltage d power supply and a reference value (Vreg).
    公开号:FR3037148A1
    申请号:FR1555212
    申请日:2015-06-08
    公开日:2016-12-09
    发明作者:Yann Bacher；Nicolas Froidevaux
    申请人:STMicroelectronics Rousset SAS；
    IPC主号:
    专利说明:

    [0001] B14104 - 14-R0-0697 1 MEASURING VARIATIONS IN A POWER SUPPLY VOLTAGE Field The present description generally relates to electronic circuits and, more particularly, to a circuit for monitoring the supply voltage of an integrated circuit.
    [0002] DISCUSSION OF THE PRIOR ART In many applications, it is desired to monitor the evolution of the supply voltage of an integrated circuit during its operation. Indeed, the variations of this supply voltage can cause problems in the operation of the circuit and / or reflect the consumption of the circuit, therefore variations in the activity of the circuit and / or reflect the behavior of the circuit under stress, for example a deliberate (for example, an attack) or accidental (for example, an electrostatic discharge) disturbance.
    [0003] The supply voltage is measured, for example for test purposes, with tips applied at different points of the circuit and connected to a measuring device. The measurement is then particularly sensitive to electromagnetic disturbances generated by the use of conductive tips. In addition, such a measurement is incompatible with a measurement in real time during the operation of the circuit in its application environment.
    [0004] 3037148 B14104 - 14-R0-0697 2 It has already been proposed internal solutions to a circuit for measuring the variations of its supply voltage. However, these solutions do not make it possible to measure non-periodic variations and the accuracy of the measurements depends on the value of the supply voltage itself, these internal circuits being sensitive to the disturbances of the supply, which is most often external to the circuit. Moreover, such measurements do not make it possible to measure voltages higher than the voltage supported by the technology.
    [0005] SUMMARY An embodiment overcomes all or part of the disadvantages of the usual circuits for measuring the supply voltage of an integrated circuit. One embodiment provides a solution for measurement within and through the circuit. One embodiment provides a solution for easily storing the result of the measurement. One embodiment proposes a solution compatible with the measurement of non-periodic variations of the supply voltage. Thus, an embodiment provides a circuit for measuring variations of a supply voltage of an electronic circuit, comprising an analog-digital converter of a difference between a value proportional to the supply voltage and a value of reference. According to one embodiment, outputs of the analog-to-digital converter provide at least a first result. According to one embodiment, the first signal is processed by at least one delay element whose output provides a second result. According to one embodiment, the reference level corresponds to a clipped value of the supply voltage.
    [0006] BRIEF DESCRIPTION OF THE DRAWINGS These and other features and advantages will be set forth in detail in the following description of particular embodiments in a non-limiting manner with reference to the accompanying drawings. which: Figure 1 shows, schematically, an embodiment of a circuit for measuring variations of the supply voltage of an integrated circuit; Figure 2 illustrates a simplified embodiment of a clipper of the measuring circuit of Figure 1; FIG. 3 is an exemplary embodiment of a converter fitted to the measuring circuit of FIG. 1; Fig. 4 is a graph showing an example of variation of the VDD voltage and illustrating the static behavior of the circuit of Fig. 3; and FIG. 5 is a timing diagram showing variation examples of the VDD voltage and illustrating the dynamic behavior of the circuit of FIG. 3. Detailed Description The same elements have been designated with the same references in the various figures. In particular, the structural and / or functional elements common to the different embodiments may have the same references and may have identical structural, dimensional and material properties. For the sake of clarity, only the elements useful for understanding the described embodiments have been shown and will be detailed. In particular, the elements present in the integrated circuit whose power supply voltage is monitored have not been detailed, the described embodiments being compatible with the usual applications. When referring to the terms "about", "approximately" or "of the order of", this means to within 10%, preferably to within 5%.
    [0007] FIG. 1 schematically represents an embodiment of a circuit for measuring variations in the supply voltage of an electronic circuit. The electronic circuit 1 is only partially represented with the elements which constitute the internal measuring circuit of the variations of its supply voltage. The rest of circuit 1 depends on the application. The circuit 1 is powered by a voltage VDD applied between a terminal 12 for applying a potential VDD and a terminal 14 defining a reference potential, typically the ground GND. The voltage VDD constitutes the supply voltage whose evolution or variations are to be monitored. According to the embodiments described, a fast voltage limiter 22 (CLIP) is provided, that is to say having a low time constant with respect to the duration of the variations to be measured. More specifically, the applications targeted by this description requiring the detection of peaks in the supply voltage, the limiter is not intended to smooth the voltage Vreg it provides output 23, but to limit the excursion 20 the voltage it provides, that is to say, to ensure that this voltage is clipped. The voltage Vreg is used to power an analog digital converter 24 (ADC) whose input (conversion) receives a voltage proportional to the voltage VDD to measure. The voltage Vreg also serves as a reference for generating the measurement voltages of the converter 24. The converter 24 supplies, as output, an n-bit RESULT digital word representative of the instantaneous value of the measured voltage. This result can be interpreted directly.
    [0008] Preferably, the output bits RESULT also pass through a delay circuit (DELAY) 26 (delay lines). The delay circuit provides a DRESULT signal which makes it possible to delay the measurement being taken into account by the rest of the circuit or by an external device. In the presence of a disturbance, there is a strong risk that the circuit or apparatus reading the result will itself be disturbed. Delaying taking into account the measure makes it possible to overcome this risk and to provide a reliable measure. Indeed, the DRESULT signal contains the disturbance but this disturbance has disappeared when this signal is supplied. Therefore, the measurement interpretation circuit, whether internal or external, can determine the perturbation. FIG. 2 shows an embodiment of the limiter 22 of FIG. 1 and a circuit 232 for adapting the measurement level of the converter 23. In the example of FIG. 2, the delay circuit 26 provides a digital signal on 16 bits (16 BITS OUTPUT). FIG. 3 represents a more detailed diagram, illustrating an exemplary embodiment of the converter 24, associated with a voltage limiter and an impedance matching.
    [0009] The regulator 22 here consists of one or more resistors RR in series with one or more diodes (for example, three) DR, the diodes being oriented, cathode towards the terminal 14. The midpoint 23 between the resistors RR and the DR diodes provides the clipped voltage Vreg. This voltage Vreg therefore varies between the ground (at the start of the circuit, the time that the voltage VDD increases) and a maximum level set by the sum of the direct voltage drops in the DR diodes. In the example of Figure 3, a single resistor RR is symbolized instead of two in Figure 2.
    [0010] On the converter side 24, the voltage Vreg is used as the measurement reference for the different bit weights of the converter. Thus, assuming as in FIG. 3, a 4-bit converter, four comparators 242 (CmpO), 244 (Cmpl), 246 (Cmp2) and 248 (Cmp3) provide the four states BO, B1, B2, B3 of the word binary. The reference inputs (for example inverting) of the comparators 242, 244, 246 and 248 are respectively connected to nodes 222, 224, 226, 228 of a series association of resistors RO, R1, R2, R3, R4, between terminal 23 and ground 14. The second inputs of comparators 242, 244, 246 and 248 (eg non-inverting) receive a Vmeas information proportional to voltage V DD. For example, these inputs are connected to the midpoint of a series association of a set of DM diodes and one or more RM resistors. Preferably, the number of DR diodes is less than or equal to the number of DM diodes. For example, the number of diodes DM corresponds to the number of diodes DR and the value of the resistor RM (or the cumulative value of the resistors in series RM) corresponds approximately to the value of the resistor RR. Thus, the converter begins to measure changes in voltage VDD once it has reached at least the value Vreg set by the DR diodes in series. FIG. 4 is a graph showing an example of variation of the voltage VDD and illustrating the static behavior of the circuit of FIG. 3.
    [0011] FIG. 4 illustrates, on voltage scales in volts (Voltage (V)), an example of growth of the voltage VDD, from a zero value, the corresponding evolution of the voltage Vreg, the voltage Vmeas and the outputs Bit binary 0 to 15 (BO to B15) of the converter 24. In the example of Figure 4, assume a 24-bit converter 24. As long as the voltage VDD has not reached the value Vreg, all the bits BO to B15 are in the state O. When the voltage VDD reaches the level Vreg, the bit BO switches to the state 1. Assuming, as In FIG. 4, a linear growth of the voltage VDD, the bits B1 to B15 switch one after the other until the voltage Vmeas reaches (approximately) the voltage Vreg. The output RESULT of the converter 24 thus provides a binary value as a function of the voltage VDD. The DRESULT output provides the same binary word, but delayed.
    [0012] FIG. 5 is a graph showing variation examples of the VDD voltage in volts (Voltage (V)) and illustrating the dynamic behavior of the circuit of FIG. 3. FIG. 5 illustrates three examples of peaks of the VDD voltage plus or minus The example of FIG. 5 assumes an 8-bit 24-bit converter with respect to the voltage Vreg and the corresponding switching of the converter bits 24. In the example of FIG. 5, an 8-bit converter 24 is assumed. Three peaks of the same amplitude but of different durations on a time scale (rhyme (s)) are assumed in nanoseconds (N).
    [0013] As illustrated in FIG. 5, the speed of the peaks results in a slower switching of the outputs of the converter. The faster the peak, the closer the outputs will switch. Similarly, the faster the peak, the faster the bits return to the idle state.
    [0014] The fact of having a digital output (on several bits) makes it possible to easily memorize the result of the measurement. The storage frequency of the values obtained depends on the application and does not depend on the measurement itself. An advantage of the embodiments described is that it is now possible to evaluate the variations of the supply voltage of an integrated circuit over time by avoiding any electromagnetic disturbances. It is thus possible to distinguish a fast variation of a slow variation of the supply voltage.
    [0015] Another advantage of the embodiments described is that the measurement being made differentially with respect to the voltage Vreg, it becomes independent of the value of the voltage VDD. Another advantage of the embodiments described is that, thanks to a measurement integrated into the circuit itself, the range of applications available for such a measurement is enriched. For example, the measurement circuit may be used to detect possible attacks of an integrated circuit by changing its supply voltage or to detect an external electrostatic discharge type disturbance. The integrated circuit can then take the necessary protective measures. Various embodiments have been described. Various variations and modifications will be apparent to those skilled in the art. In particular, the number of bits of the converter depends on the application and the desired accuracy in the evaluation of the voltage value. Moreover, it is also possible to adapt the conversion speed according to the behavior that one wishes to measure. In addition, the choice of detection thresholds also depends on the application. According to another variant, the circuit 5 is adapted to measure negative voltage peaks. Finally, the practical implementation of the embodiments that have been described is within the abilities of those skilled in the art from the functional indications given above.
    权利要求:
    Claims (4)
    [0001]
    REVENDICATIONS1. Circuit for measuring variations of a supply voltage (VDD) of an electronic circuit (1), comprising an analog-digital converter (24) of a difference between a value (Vmeas) proportional to the supply voltage and a reference value (Vreg).
    [0002]
    2. Measuring circuit according to claim 1, wherein outputs of the analog-to-digital converter (24) provide at least a first result (RESULT).
    [0003]
    3. Measuring circuit according to claim 2, wherein the first signal is processed by at least one delay element (26) whose output provides a second result (DRESULT).
    [0004]
    4. Measuring circuit according to any one of claims 1 to 3, wherein the reference level (Vreg) 15 corresponds to a clipped value of the supply voltage (VDD).
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    同族专利:
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    US9638728B2|2017-05-02|
    CN106249036B|2020-04-14|
    EP3159707A1|2017-04-26|
    EP3159707B1|2020-12-30|
    US20160356828A1|2016-12-08|
    CN205941679U|2017-02-08|
    CN106249036A|2016-12-21|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    FR2719123A1|1994-04-22|1995-10-27|Matra Mhs|Device for detecting the non-transient variation of a supply voltage.|
    FR2783636A1|1998-09-18|2000-03-24|Ck Electronics Sdn Bhd|In-situ monitoring method for motor vehicle battery in use involves indicating liquid electrolyte level and level of battery plate deterioration by monitoring ripple voltage|
    US20140184184A1|2011-09-22|2014-07-03|Panasonic Corporation|Voltage detecting circuit and voltage regulator apparatus provided with same|
    FR2996309A1|2012-09-28|2014-04-04|Valeo Sys Controle Moteur Sas|METHOD AND DEVICE FOR MEASURING AN ISOLATED VOLTAGE|
    US5942937A|1997-11-19|1999-08-24|Advanced Micro Devices, Inc.|Signal detection circuit using a plurality of delay stages with edge detection logic|
    US6229364B1|1999-03-23|2001-05-08|Infineon Technologies North America Corp.|Frequency range trimming for a delay line|
    US7023190B2|2003-02-10|2006-04-04|Power-One, Inc.|ADC transfer function providing improved dynamic regulation in a switched mode power supply|
    DE102006009240B4|2006-02-28|2009-09-10|Continental Automotive Gmbh|Engine control unit and method for evaluating a sensor current signal|
    US7642943B1|2006-12-22|2010-01-05|Cypress Semiconductor Corporation|Analog-to-digital converter circuit and method with programmable resolution|
    US7760124B2|2008-12-02|2010-07-20|Infineon Technologies Ag|System and method for A/D conversion|
    US8798768B2|2011-06-30|2014-08-05|Greatbatch Ltd.|Electrically identifiable electrode lead and method of electrically identifying an electrode lead|
    US9128132B2|2011-12-15|2015-09-08|National Instruments Corporation|Resampling a signal to perform power quality and synchrophasor measurement|
    CN103873038B|2012-12-17|2017-02-08|快捷半导体有限公司|Delay time adjusting circuit, delay time adjusting method and integrated circuit|
    FR3037148B1|2015-06-08|2018-08-17|Stmicroelectronics Sas|MEASURING VARIATIONS IN A POWER SUPPLY VOLTAGE|FR3037148B1|2015-06-08|2018-08-17|StmicroelectronicsSas|MEASURING VARIATIONS IN A POWER SUPPLY VOLTAGE|
    CN107527588B|2017-10-27|2020-08-25|京东方科技集团股份有限公司|Display driving circuit, driving method thereof and display device|
    KR102256602B1|2017-12-14|2021-05-26|주식회사 엘지에너지솔루션|Apparatus and method for measuring voltage|
    法律状态:
    2016-05-24| PLFP| Fee payment|Year of fee payment: 2 |
    2016-12-09| PLSC| Publication of the preliminary search report|Effective date: 20161209 |
    2017-05-23| PLFP| Fee payment|Year of fee payment: 3 |
    2018-05-25| PLFP| Fee payment|Year of fee payment: 4 |
    2020-03-13| ST| Notification of lapse|Effective date: 20200206 |
    优先权:
    申请号 | 申请日 | 专利标题
    FR1555212|2015-06-08|
    FR1555212A|FR3037148B1|2015-06-08|2015-06-08|MEASURING VARIATIONS IN A POWER SUPPLY VOLTAGE|FR1555212A| FR3037148B1|2015-06-08|2015-06-08|MEASURING VARIATIONS IN A POWER SUPPLY VOLTAGE|
    US14/947,858| US9638728B2|2015-06-08|2015-11-20|Measurement of variations of a power supply voltage|
    EP16168687.8A| EP3159707B1|2015-06-08|2016-05-09|Measurement of variations of an input voltage|
    CN201620509433.4U| CN205941679U|2015-06-08|2016-05-30|Measuring circuit and system are carried out to deviation to power supply voltage|
    CN201610371781.4A| CN106249036B|2015-06-08|2016-05-30|Measurement of the deviation of a supply voltage|
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